Causality Causality Workbench                                                             Challenges in Machine Learning Causality
Filtering by keyword: Intelligent Systems [X]
 
Rating : (1 vote)

SECOM: SEmi COnductor Manufacturing process control data

Contact: Michael McCann - Submitted: 2008-11-19 18:55 - Views : 3286

Abstract: A complex modern semi-conductor manufacturing process is normally under consistent surveillance via the monitoring of signals/variables collected from sensors and or process measurement points. However, not all of these signals are equally...  [more/question/discuss/rate/edit...]